Combined Polynomial and Periodic Moments for the Analysis of Measured 3D Surfaces
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Combined Polynomial and Periodic Moments for the Analysis of Measured 3D Surfaces. / O'Leary, Paul; Harker, Matthew; Suesut, Taweepol.
IEEE International Instrumentation and Measurement Technology Conference 2008. 2008. S. 354-358.
IEEE International Instrumentation and Measurement Technology Conference 2008. 2008. S. 354-358.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
O'Leary, P, Harker, M & Suesut, T 2008, Combined Polynomial and Periodic Moments for the Analysis of Measured 3D Surfaces. in IEEE International Instrumentation and Measurement Technology Conference 2008. S. 354-358. https://doi.org/10.1109/IMTC.2008.4547060
APA
O'Leary, P., Harker, M., & Suesut, T. (2008). Combined Polynomial and Periodic Moments for the Analysis of Measured 3D Surfaces. In IEEE International Instrumentation and Measurement Technology Conference 2008 (S. 354-358) https://doi.org/10.1109/IMTC.2008.4547060
Vancouver
O'Leary P, Harker M, Suesut T. Combined Polynomial and Periodic Moments for the Analysis of Measured 3D Surfaces. in IEEE International Instrumentation and Measurement Technology Conference 2008. 2008. S. 354-358 doi: 10.1109/IMTC.2008.4547060
Author
Bibtex - Download
@inproceedings{61e58d2d5ef74319ae3ccf42721575a7,
title = "Combined Polynomial and Periodic Moments for the Analysis of Measured 3D Surfaces",
author = "Paul O'Leary and Matthew Harker and Taweepol Suesut",
year = "2008",
doi = "10.1109/IMTC.2008.4547060",
language = "English",
isbn = "978-1-4244-1540-3",
pages = "354--358",
booktitle = "IEEE International Instrumentation and Measurement Technology Conference 2008",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Combined Polynomial and Periodic Moments for the Analysis of Measured 3D Surfaces
AU - O'Leary, Paul
AU - Harker, Matthew
AU - Suesut, Taweepol
PY - 2008
Y1 - 2008
U2 - 10.1109/IMTC.2008.4547060
DO - 10.1109/IMTC.2008.4547060
M3 - Conference contribution
SN - 978-1-4244-1540-3
SP - 354
EP - 358
BT - IEEE International Instrumentation and Measurement Technology Conference 2008
ER -
