Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications

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Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications. / Galiana, B.; Rey-Stolle, I.; Beinik, Igor et al.
in: Solar energy materials and solar cells, Jahrgang 95, 2011, S. 1949-1954.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{bf6a7dacdcf2465692c215f21fa7ae0f,
title = "Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications",
author = "B. Galiana and I. Rey-Stolle and Igor Beinik and Christian Teichert and C. Algora and Molina-Aldareguia, {J. M.} and P. Tejedor",
year = "2011",
doi = "10.1016/j.solmat.2010.12.021",
language = "English",
volume = "95",
pages = "1949--1954",
journal = "Solar energy materials and solar cells",
issn = "0927-0248",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications

AU - Galiana, B.

AU - Rey-Stolle, I.

AU - Beinik, Igor

AU - Teichert, Christian

AU - Algora, C.

AU - Molina-Aldareguia, J. M.

AU - Tejedor, P.

PY - 2011

Y1 - 2011

U2 - 10.1016/j.solmat.2010.12.021

DO - 10.1016/j.solmat.2010.12.021

M3 - Article

VL - 95

SP - 1949

EP - 1954

JO - Solar energy materials and solar cells

JF - Solar energy materials and solar cells

SN - 0927-0248

ER -