Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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in: Solar energy materials and solar cells, Jahrgang 95, 2011, S. 1949-1954.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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TY - JOUR
T1 - Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
AU - Galiana, B.
AU - Rey-Stolle, I.
AU - Beinik, Igor
AU - Teichert, Christian
AU - Algora, C.
AU - Molina-Aldareguia, J. M.
AU - Tejedor, P.
PY - 2011
Y1 - 2011
U2 - 10.1016/j.solmat.2010.12.021
DO - 10.1016/j.solmat.2010.12.021
M3 - Article
VL - 95
SP - 1949
EP - 1954
JO - Solar energy materials and solar cells
JF - Solar energy materials and solar cells
SN - 0927-0248
ER -