Analysis System: Combined Thermographic and Geometric Inspection
Publikationen: Patent › Patentschrift
Standard
Analysis System: Combined Thermographic and Geometric Inspection. / O'Leary, Paul (Erfinder); Oswald-Tranta, Beata (Erfinder); Wally, Gernot (Erfinder).
Patent Nr.: PCT/EP2006/011949. Dez. 12, 2006.
Patent Nr.: PCT/EP2006/011949. Dez. 12, 2006.
Publikationen: Patent › Patentschrift
Harvard
O'Leary, P, Oswald-Tranta, B & Wally, G Dez.. 12 2006, Analysis System: Combined Thermographic and Geometric Inspection, Patent Nr. PCT/EP2006/011949.
APA
O'Leary, P., Oswald-Tranta, B., & Wally, G. (2006). Analysis System: Combined Thermographic and Geometric Inspection. (Patent Nr. PCT/EP2006/011949).
Vancouver
O'Leary P, Oswald-Tranta B, Wally G, Erfinder/-innen. Analysis System: Combined Thermographic and Geometric Inspection. PCT/EP2006/011949. 2006 Dez 12.
Author
Bibtex - Download
@misc{02b8595e62c8467cbfaef321e58c4e35,
title = "Analysis System: Combined Thermographic and Geometric Inspection",
author = "Paul O'Leary and Beata Oswald-Tranta and Gernot Wally",
year = "2006",
month = dec,
day = "12",
language = "Deutsch",
type = "Patent",
note = "PCT/EP2006/011949",
}
RIS (suitable for import to EndNote) - Download
TY - PAT
T1 - Analysis System: Combined Thermographic and Geometric Inspection
AU - O'Leary, Paul
AU - Oswald-Tranta, Beata
AU - Wally, Gernot
PY - 2006/12/12
Y1 - 2006/12/12
M3 - Patentschrift
M1 - PCT/EP2006/011949
ER -
