Understanding amorphization mechanisms using ion irradiation in situ a TEM and 3D damage reconstruction

Camara, O., Tunes, M. A., Greaves, G., Mir, A. H., Donnelly, S. & Hinks, J. A., 29 Aug. 2019, (Elektronische Veröffentlichung vor Drucklegung.) in: Ultramicroscopy. 207.2019, December, 8 S., 112838.

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Theoretical analysis of the momentum-dependent loss function of bulk Ag

Alkauskas, A., Schneider, S., Sagmeister, S., Draxl, C. & Hèbert, C., 2010, in: Ultramicroscopy. 110, S. 1081-1081

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The morphology of secondary-hardening carbides in a martensitic steel at the peak hardness by 3DFIM

Akre, J., Danoix, F., Leitner, H. & Auger, P., 2009, in: Ultramicroscopy. 109, S. 518-523

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Precipitation evolution in a Ti-free and Ti-containing stainless maraging steel

Schober, M., Schnitzer, R. & Leitner, H., 2009, in: Ultramicroscopy. S. 553-562

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HAnSIS software tool for the automated analysis of HOLZ lines

Holec, D., Humphreys, C. J. & Rao, D. V. S., 2009, in: Ultramicroscopy. 109, S. 837-844

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Grain boundary study of technically pure molybdenum by combining APT and TKD

Babinsky, K., Knabl, W., Lorich, A., De Kloe, R., Clemens, H. & Primig, S., 2015, in: Ultramicroscopy. 159, S. 445-451 7 S.

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Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing

Tkadletz, M., Waldl, H., Schiester, M., Lechner, A., Schusser, G., Krause, M. & Schalk, N., Apr. 2023, in: Ultramicroscopy. 246.2023, April, 5 S., 113672.

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Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument study

Schiester, M., Waldl, H., Rice, K. P., Hans, M., Primetzhofer, D., Schalk, N. & Tkadletz, M., 17 Jan. 2025, in: Ultramicroscopy. 270.2025, April, 10 S., 114105.

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Decomposition of CrN induced by laser-assisted atom probe tomography

Waldl, H., Hans, M., Schiester, M., Primetzhofer, D., Burtscher, M., Schalk, N. & Tkadletz, M., Apr. 2023, in: Ultramicroscopy. 246.2023, April, 8 S., 113673.

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A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction

Babinsky, K., De Kloe, R., Clemens, H. & Primig, S., 2014, in: Ultramicroscopy. 144, S. 9-18

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