The 84th IUVSTA Workshop Surface Micro-Spectroscopy and Spectro- Microscopy of Electrical Phenomena: Advanced Methodologies for Nano-Characterization of Electronic Surface Phenomena, September 2-5, 2018, Weizmann Institute of Science, Rehovot, Israel
Aktivität: Teilnahme an oder Organisation einer Veranstaltung › Konferenzteilnahme
Teilnehmer
- Christian Teichert - Redner/-in
Datum
2 Sept. 2018 → 4 Sept. 2018
Christian Teichert - Redner/-in
Light-assisted charge spreading and charge trapping in 1D organic semiconductor nanocrystals on 2D materials probed by AFM based techniques
2 Sept. 2018 → 4 Sept. 2018
The 84th IUVSTA Workshop Surface Micro-Spectroscopy and Spectro- Microscopy of Electrical Phenomena: Advanced Methodologies for Nano-Characterization of Electronic Surface Phenomena, September 2-5, 2018, Weizmann Institute of Science, Rehovot, Israel
| Dauer | 2 Sept. 2018 → 4 Sept. 2018 |
|---|---|
| Ort | Rehovot |
| Land/Gebiet | Israel |
| Bekanntheitsgrad | Internationale Veranstaltung |
Veranstaltung: Konferenz
