Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems
Research output: Contribution to journal › Article › Research › peer-review
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Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems. / Coleman, Kathleen; Bermejo, Raul; Leguillon, Dominique et al.
In: Acta Materialia, Vol. 191, 06.2020, p. 245-252.
In: Acta Materialia, Vol. 191, 06.2020, p. 245-252.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Coleman, K, Bermejo, R, Leguillon, D & Trolier-McKinstry, S 2020, 'Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems', Acta Materialia, vol. 191, pp. 245-252. https://doi.org/10.1016/j.actamat.2020.03.030
APA
Coleman, K., Bermejo, R., Leguillon, D., & Trolier-McKinstry, S. (2020). Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems. Acta Materialia, 191, 245-252. https://doi.org/10.1016/j.actamat.2020.03.030
Vancouver
Coleman K, Bermejo R, Leguillon D, Trolier-McKinstry S. Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems. Acta Materialia. 2020 Jun;191:245-252. doi: 10.1016/j.actamat.2020.03.030
Author
Bibtex - Download
@article{f725c5baa1f9461e868bcb76543b2b1e,
title = "Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems",
keywords = "Thin film, PZT, Cracking, Stress criterion, Biaxial bending",
author = "Kathleen Coleman and Raul Bermejo and Dominique Leguillon and Susan Trolier-McKinstry",
year = "2020",
month = jun,
doi = "10.1016/j.actamat.2020.03.030",
language = "Undefined/Unknown",
volume = "191",
pages = "245--252",
journal = "Acta Materialia",
issn = "1359-6454",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems
AU - Coleman, Kathleen
AU - Bermejo, Raul
AU - Leguillon, Dominique
AU - Trolier-McKinstry, Susan
PY - 2020/6
Y1 - 2020/6
KW - Thin film, PZT, Cracking, Stress criterion, Biaxial bending
UR - https://doi.org/10.1016/j.actamat.2020.03.030
U2 - 10.1016/j.actamat.2020.03.030
DO - 10.1016/j.actamat.2020.03.030
M3 - Article
VL - 191
SP - 245
EP - 252
JO - Acta Materialia
JF - Acta Materialia
SN - 1359-6454
ER -
