The influence of surface modification on the electrical properties of silicon carbide flakes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Standard

The influence of surface modification on the electrical properties of silicon carbide flakes. / Pleşa, Ilona; Schlögl, Sandra; Radl, Simone Viola et al.
2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015. Institute of Electrical and Electronics Engineers, 2015. p. 460-463 7133858 (2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Harvard

Pleşa, I, Schlögl, S, Radl, SV, Mühlbacher, I & Schichler, U 2015, The influence of surface modification on the electrical properties of silicon carbide flakes. in 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015., 7133858, 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015, Institute of Electrical and Electronics Engineers, pp. 460-463, 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015, Bucharest, Romania, 7/05/15. https://doi.org/10.1109/ATEE.2015.7133858

APA

Pleşa, I., Schlögl, S., Radl, S. V., Mühlbacher, I., & Schichler, U. (2015). The influence of surface modification on the electrical properties of silicon carbide flakes. In 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015 (pp. 460-463). Article 7133858 (2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ATEE.2015.7133858

Vancouver

Pleşa I, Schlögl S, Radl SV, Mühlbacher I, Schichler U. The influence of surface modification on the electrical properties of silicon carbide flakes. In 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015. Institute of Electrical and Electronics Engineers. 2015. p. 460-463. 7133858. (2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015). doi: 10.1109/ATEE.2015.7133858

Author

Pleşa, Ilona ; Schlögl, Sandra ; Radl, Simone Viola et al. / The influence of surface modification on the electrical properties of silicon carbide flakes. 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015. Institute of Electrical and Electronics Engineers, 2015. pp. 460-463 (2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015).

Bibtex - Download

@inproceedings{6c15ededc96c463a858da0cc3d14db04,
title = "The influence of surface modification on the electrical properties of silicon carbide flakes",
keywords = "Current-Voltage Characteristics, Optical Microscopy, Organic Layer, Silicon Carbide, Surface Functionalization, X-ray Photoelectron Spectroscopy, Zeta-Potential Measurements",
author = "Ilona Ple{\c s}a and Sandra Schl{\"o}gl and Radl, {Simone Viola} and Inge M{\"u}hlbacher and Uwe Schichler",
year = "2015",
month = jun,
day = "24",
doi = "10.1109/ATEE.2015.7133858",
language = "English",
series = "2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015",
publisher = "Institute of Electrical and Electronics Engineers",
pages = "460--463",
booktitle = "2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015",
address = "United States",
note = "2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015 ; Conference date: 07-05-2015 Through 09-05-2015",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - The influence of surface modification on the electrical properties of silicon carbide flakes

AU - Pleşa, Ilona

AU - Schlögl, Sandra

AU - Radl, Simone Viola

AU - Mühlbacher, Inge

AU - Schichler, Uwe

PY - 2015/6/24

Y1 - 2015/6/24

KW - Current-Voltage Characteristics

KW - Optical Microscopy

KW - Organic Layer

KW - Silicon Carbide

KW - Surface Functionalization

KW - X-ray Photoelectron Spectroscopy

KW - Zeta-Potential Measurements

UR - http://www.scopus.com/inward/record.url?scp=84939498981&partnerID=8YFLogxK

U2 - 10.1109/ATEE.2015.7133858

DO - 10.1109/ATEE.2015.7133858

M3 - Conference contribution

AN - SCOPUS:84939498981

T3 - 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015

SP - 460

EP - 463

BT - 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015

PB - Institute of Electrical and Electronics Engineers

T2 - 2015 9th International Symposium on Advanced Topics in Electrical Engineering, ATEE 2015

Y2 - 7 May 2015 through 9 May 2015

ER -

View graph of relations

SFX

Publication SFX