Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy

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Authors

Translated title of the contribution	Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy
Original language	English
Pages (from-to)	1328-1337
Journal	Acta materialia
Volume	59
DOIs	https://doi.org/10.1016/j.actamat.2010.10.065
Publication status	Published - 2011