Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured thin films: Experiment and model

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Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured thin films: Experiment and model. / Daniel, Rostislav; Holec, David; Bartosik, Matthias et al.
In: Acta materialia, Vol. 59, 2011, p. 6631-6645.

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@article{9f95f40cde454466aa6d3b8c7d0170a6,
title = "Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured thin films: Experiment and model",
author = "Rostislav Daniel and David Holec and Matthias Bartosik and Jozef Keckes and Christian Mitterer",
year = "2011",
doi = "10.1016/j.actamat.2011.07.018",
language = "English",
volume = "59",
pages = "6631--6645",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured thin films: Experiment and model

AU - Daniel, Rostislav

AU - Holec, David

AU - Bartosik, Matthias

AU - Keckes, Jozef

AU - Mitterer, Christian

PY - 2011

Y1 - 2011

U2 - 10.1016/j.actamat.2011.07.018

DO - 10.1016/j.actamat.2011.07.018

M3 - Article

VL - 59

SP - 6631

EP - 6645

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

ER -