Research output

  1. 2005
  2. Published

    Sekundärionen-Massensprektroskopie (SIMS) mittels FIB

    Motz, C., Kiener, D., Schöberl, T., Pippan, R. & Dehm, G., 2005, Handbuch der Nanoanalytik. p. 199-200

    Research output: Chapter in Book/Report/Conference proceedingChapterResearch

  3. 2004
  4. Published

    Microstructural characterization of deformed volume beneath microindentations using FIB, EBSD and TEM

    Motz, C., Kiener, D., Kreuzer, H., Prantl, W. & Pippan, R., 2004, Proceedings of the 25th Risø International Symposium on Materials Science: Evolution of Deformation Microstructures in 3D. p. 459-464

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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