Scanning electron microscope: An essential equipment of failure analysis
Research output: Contribution to conference › Poster › Research
Standard
Scanning electron microscope: An essential equipment of failure analysis. / Panzenböck, Michael; Freitag, Caroline; Hawranek, Gerhard et al.
2018. Poster session presented at Microscopy & Microanalysis , Baltimore, United States.
2018. Poster session presented at Microscopy & Microanalysis , Baltimore, United States.
Research output: Contribution to conference › Poster › Research
Harvard
Panzenböck, M, Freitag, C, Hawranek, G, Mendez Martin, F & Rashkova, B 2018, 'Scanning electron microscope: An essential equipment of failure analysis', Microscopy & Microanalysis , Baltimore, United States, 5/08/18 - 9/08/18.
APA
Panzenböck, M., Freitag, C., Hawranek, G., Mendez Martin, F., & Rashkova, B. (2018). Scanning electron microscope: An essential equipment of failure analysis. Poster session presented at Microscopy & Microanalysis , Baltimore, United States.
Vancouver
Panzenböck M, Freitag C, Hawranek G, Mendez Martin F, Rashkova B. Scanning electron microscope: An essential equipment of failure analysis. 2018. Poster session presented at Microscopy & Microanalysis , Baltimore, United States.
Author
Bibtex - Download
@conference{2a9daefc702e448aafba45b2106501f2,
title = "Scanning electron microscope: An essential equipment of failure analysis",
author = "Michael Panzenb{\"o}ck and Caroline Freitag and Gerhard Hawranek and {Mendez Martin}, Francisca and Boryana Rashkova",
year = "2018",
language = "English",
note = "Microscopy & Microanalysis ; Conference date: 05-08-2018 Through 09-08-2018",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Scanning electron microscope: An essential equipment of failure analysis
AU - Panzenböck, Michael
AU - Freitag, Caroline
AU - Hawranek, Gerhard
AU - Mendez Martin, Francisca
AU - Rashkova, Boryana
PY - 2018
Y1 - 2018
M3 - Poster
T2 - Microscopy & Microanalysis
Y2 - 5 August 2018 through 9 August 2018
ER -
