Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

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Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy. / Bucher, Edith; Gspan, Christian; Hofer, Ferdinand et al.
In: Solid State Ionics, Vol. 230, 2013, p. 7-11.

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@article{9f6a72625e4b45b4b2cdbc816a13cbb2,
title = "Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy",
author = "Edith Bucher and Christian Gspan and Ferdinand Hofer and Werner Sitte",
year = "2013",
language = "English",
volume = "230",
pages = "7--11",
journal = "Solid State Ionics",
issn = "0167-2738",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy

AU - Bucher, Edith

AU - Gspan, Christian

AU - Hofer, Ferdinand

AU - Sitte, Werner

PY - 2013

Y1 - 2013

M3 - Article

VL - 230

SP - 7

EP - 11

JO - Solid State Ionics

JF - Solid State Ionics

SN - 0167-2738

ER -