Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy
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Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy. / Bucher, Edith; Gspan, Christian; Hofer, Ferdinand et al.
In: Solid State Ionics, Vol. 230, 2013, p. 7-11.
In: Solid State Ionics, Vol. 230, 2013, p. 7-11.
Research output: Contribution to journal › Article › Research › peer-review
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Bucher, E, Gspan, C, Hofer, F & Sitte, W 2013, 'Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy', Solid State Ionics, vol. 230, pp. 7-11.
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Bibtex - Download
@article{9f6a72625e4b45b4b2cdbc816a13cbb2,
title = "Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy",
author = "Edith Bucher and Christian Gspan and Ferdinand Hofer and Werner Sitte",
year = "2013",
language = "English",
volume = "230",
pages = "7--11",
journal = "Solid State Ionics",
issn = "0167-2738",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3-delta by transmission electron microscopy
AU - Bucher, Edith
AU - Gspan, Christian
AU - Hofer, Ferdinand
AU - Sitte, Werner
PY - 2013
Y1 - 2013
M3 - Article
VL - 230
SP - 7
EP - 11
JO - Solid State Ionics
JF - Solid State Ionics
SN - 0167-2738
ER -
