Observation of structural depth profile of porous silicon by atomic force microscopy
Research output: Contribution to journal › Article › Research › peer-review
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Observation of structural depth profile of porous silicon by atomic force microscopy. / Prohaska, Thomas; Chang, D.
In: Journal of porous materials, 2000, p. 349-352.
In: Journal of porous materials, 2000, p. 349-352.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Prohaska, T & Chang, D 2000, 'Observation of structural depth profile of porous silicon by atomic force microscopy', Journal of porous materials, pp. 349-352.
APA
Prohaska, T., & Chang, D. (2000). Observation of structural depth profile of porous silicon by atomic force microscopy. Journal of porous materials, 349-352.
Vancouver
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Bibtex - Download
@article{06f134882cd8478e969f9748d62d4f91,
title = "Observation of structural depth profile of porous silicon by atomic force microscopy",
author = "Thomas Prohaska and D. Chang",
year = "2000",
language = "English",
pages = "349--352",
journal = " Journal of porous materials",
issn = "1573-4854",
publisher = "Kluwer Academic Publishers",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Observation of structural depth profile of porous silicon by atomic force microscopy
AU - Prohaska, Thomas
AU - Chang, D.
PY - 2000
Y1 - 2000
M3 - Article
SP - 349
EP - 352
JO - Journal of porous materials
JF - Journal of porous materials
SN - 1573-4854
ER -
