Novel technique to determine elastic constants of thin films

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Novel technique to determine elastic constants of thin films. / Daniel, R.; Keckes, J.; Martinschitz, K.J. et al.
In: Materials Research Society symposium proceedings, 2009.

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@article{99e4a2aaab08482c9156f7f9142632e5,
title = "Novel technique to determine elastic constants of thin films",
author = "R. Daniel and J. Keckes and K.J. Martinschitz and Ch Mitterer",
year = "2009",
language = "English",
journal = "Materials Research Society symposium proceedings",
issn = "0272-9172",
publisher = "North-Holland Publ Co",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Novel technique to determine elastic constants of thin films

AU - Daniel, R.

AU - Keckes, J.

AU - Martinschitz, K.J.

AU - Mitterer, Ch

PY - 2009

Y1 - 2009

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-70449556888&partnerID=MN8TOARS

M3 - Article

JO - Materials Research Society symposium proceedings

JF - Materials Research Society symposium proceedings

SN - 0272-9172

ER -