Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings
Research output: Contribution to conference › Poster › Research › peer-review
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Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings. / Bartosik, M.; Daniel, Rostislav; Mitterer, Christian et al.
2011. Poster session presented at Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France.
2011. Poster session presented at Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Bartosik, M, Daniel, R, Mitterer, C, Schoeder, S, Burghammer, M & Keckes, J 2011, 'Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings', Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France, 16/10/11.
APA
Bartosik, M., Daniel, R., Mitterer, C., Schoeder, S., Burghammer, M., & Keckes, J. (2011). Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings. Poster session presented at Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France.
Vancouver
Bartosik M, Daniel R, Mitterer C, Schoeder S, Burghammer M, Keckes J. Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings. 2011. Poster session presented at Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France.
Author
Bibtex - Download
@conference{6e381709e0e94880beef4fb379231cc3,
title = "Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings",
author = "M. Bartosik and Rostislav Daniel and Christian Mitterer and S. Schoeder and M. Burghammer and Jozef Keckes",
year = "2011",
language = "English",
note = "Size and Strain VI - Diffraction Analysis of the Microstructure of Materials ; Conference date: 16-10-2011",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings
AU - Bartosik, M.
AU - Daniel, Rostislav
AU - Mitterer, Christian
AU - Schoeder, S.
AU - Burghammer, M.
AU - Keckes, Jozef
PY - 2011
Y1 - 2011
M3 - Poster
T2 - Size and Strain VI - Diffraction Analysis of the Microstructure of Materials
Y2 - 16 October 2011
ER -
