Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

Research output: Contribution to conferencePosterResearchpeer-review

Standard

Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings. / Bartosik, M.; Daniel, Rostislav; Mitterer, Christian et al.
2011. Poster session presented at Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France.

Research output: Contribution to conferencePosterResearchpeer-review

Harvard

Bartosik, M, Daniel, R, Mitterer, C, Schoeder, S, Burghammer, M & Keckes, J 2011, 'Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings', Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France, 16/10/11.

APA

Bartosik, M., Daniel, R., Mitterer, C., Schoeder, S., Burghammer, M., & Keckes, J. (2011). Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings. Poster session presented at Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France.

Vancouver

Bartosik M, Daniel R, Mitterer C, Schoeder S, Burghammer M, Keckes J. Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings. 2011. Poster session presented at Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France.

Author

Bartosik, M. ; Daniel, Rostislav ; Mitterer, Christian et al. / Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings. Poster session presented at Size and Strain VI - Diffraction Analysis of the Microstructure of Materials, Hyères, France.

Bibtex - Download

@conference{6e381709e0e94880beef4fb379231cc3,
title = "Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings",
author = "M. Bartosik and Rostislav Daniel and Christian Mitterer and S. Schoeder and M. Burghammer and Jozef Keckes",
year = "2011",
language = "English",
note = "Size and Strain VI - Diffraction Analysis of the Microstructure of Materials ; Conference date: 16-10-2011",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

AU - Bartosik, M.

AU - Daniel, Rostislav

AU - Mitterer, Christian

AU - Schoeder, S.

AU - Burghammer, M.

AU - Keckes, Jozef

PY - 2011

Y1 - 2011

M3 - Poster

T2 - Size and Strain VI - Diffraction Analysis of the Microstructure of Materials

Y2 - 16 October 2011

ER -