Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning

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Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning. / Perz, Martin; Bucher, Edith; Gspan, Christian et al.
In: Solid State Ionics, Vol. 288, 2016, p. 22-27.

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@article{cc16478138664f01a24c9f093a68970d,
title = "Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning",
author = "Martin Perz and Edith Bucher and Christian Gspan and J{\"o}rg Waldh{\"a}usl and Ferdinand Hofer and Werner Sitte",
year = "2016",
language = "English",
volume = "288",
pages = "22--27",
journal = "Solid State Ionics",
issn = "0167-2738",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning

AU - Perz, Martin

AU - Bucher, Edith

AU - Gspan, Christian

AU - Waldhäusl, Jörg

AU - Hofer, Ferdinand

AU - Sitte, Werner

PY - 2016

Y1 - 2016

M3 - Article

VL - 288

SP - 22

EP - 27

JO - Solid State Ionics

JF - Solid State Ionics

SN - 0167-2738

ER -