Implementation of Rugged Measurement System on Electric Vehicle
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Standard
Implementation of Rugged Measurement System on Electric Vehicle. / Weiß, Helmut; Ying, Yin; Tang, Xin et al.
8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings. 2006. p. 166-172.
8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings. 2006. p. 166-172.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Harvard
Weiß, H, Ying, Y, Tang, X, Li, X & Li, X 2006, Implementation of Rugged Measurement System on Electric Vehicle. in 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings. pp. 166-172. <http://www.nstu.ru>
APA
Weiß, H., Ying, Y., Tang, X., Li, X., & Li, X. (2006). Implementation of Rugged Measurement System on Electric Vehicle. In 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings (pp. 166-172) http://www.nstu.ru
Vancouver
Weiß H, Ying Y, Tang X, Li X, Li X. Implementation of Rugged Measurement System on Electric Vehicle. In 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings. 2006. p. 166-172
Author
Bibtex - Download
@inproceedings{6f84f59991c04a1db0f0a603e8a21560,
title = "Implementation of Rugged Measurement System on Electric Vehicle",
author = "Helmut Wei{\ss} and Yin Ying and Xin Tang and Xiaonan Li and Xiaodong Li",
year = "2006",
language = "English",
isbn = "5-7782-0662-3",
pages = "166--172",
booktitle = "8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Implementation of Rugged Measurement System on Electric Vehicle
AU - Weiß, Helmut
AU - Ying, Yin
AU - Tang, Xin
AU - Li, Xiaonan
AU - Li, Xiaodong
PY - 2006
Y1 - 2006
M3 - Conference contribution
SN - 5-7782-0662-3
SP - 166
EP - 172
BT - 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings
ER -
