Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

Research output: Contribution to journal › Comment/debate › peer-review

Standard

Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)). / Beinik, Igor; Kratzer, Markus; Wachauer, Astrid et al.
In: Journal of applied physics, Vol. 112.2012, No. 7, 079903, 01.10.2012.

Research output: Contribution to journal › Comment/debate › peer-review

Harvard

Beinik, I, Kratzer, M, Wachauer, A, Wang, L, Lechner, R, Teichert, C, Motz, C, Anwand, W, Brauer, G, Chen, XY, Hsu, YF & Djurišić, AB 2012, 'Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))', Journal of applied physics, vol. 112.2012, no. 7, 079903. https://doi.org/10.1063/1.4758293

APA

Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F., & Djurišić, A. B. (2012). Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)). Journal of applied physics, 112.2012(7), Article 079903. https://doi.org/10.1063/1.4758293

Vancouver

Beinik I, Kratzer M, Wachauer A, Wang L, Lechner R, Teichert C et al. Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)). Journal of applied physics. 2012 Oct 1;112.2012(7):079903. doi: 10.1063/1.4758293

Author

Beinik, Igor ; Kratzer, Markus ; Wachauer, Astrid et al. / Erratum : Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)). In: Journal of applied physics. 2012 ; Vol. 112.2012, No. 7.

Bibtex - Download

@article{35b3d105f5974687b0939d6b7c6ee80b,
title = "Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))",
author = "Igor Beinik and Markus Kratzer and Astrid Wachauer and Lin Wang and Rainer Lechner and Christian Teichert and Christian Motz and W. Anwand and Gerhard Brauer and Chen, {Xin Yi} and Hsu, {Yuk Fan} and Djuri{\v s}i{\'c}, {Aleksandra B.}",
year = "2012",
month = oct,
day = "1",
doi = "10.1063/1.4758293",
language = "English",
volume = "112.2012",
journal = "Journal of applied physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "7",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Erratum

T2 - Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

AU - Beinik, Igor

AU - Kratzer, Markus

AU - Wachauer, Astrid

AU - Wang, Lin

AU - Lechner, Rainer

AU - Teichert, Christian

AU - Motz, Christian

AU - Anwand, W.

AU - Brauer, Gerhard

AU - Chen, Xin Yi

AU - Hsu, Yuk Fan

AU - Djurišić, Aleksandra B.

PY - 2012/10/1

Y1 - 2012/10/1

UR - http://www.scopus.com/inward/record.url?scp=84867523502&partnerID=8YFLogxK

U2 - 10.1063/1.4758293

DO - 10.1063/1.4758293

M3 - Comment/debate

AN - SCOPUS:84867523502

VL - 112.2012

JO - Journal of applied physics

JF - Journal of applied physics

SN - 0021-8979

IS - 7

M1 - 079903

ER -

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