Development of a Distributed Vision System for Industrial Conditions

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Development of a Distributed Vision System for Industrial Conditions. / Weiss, Michael; Schiller, Arnulf; O'Leary, Paul et al.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 5132, 01.12.2003, p. 91-102.

Research output: Contribution to journalConference articlepeer-review

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@article{f366d318a571421fb9cabdf020488e10,
title = "Development of a Distributed Vision System for Industrial Conditions",
keywords = "Distributed measurement and vision systems, Fitting, Grassmann reduction, Planner line coordinates, Platform independent communication framework, Quality observation at a wire rolling mill, Singular value decomposition",
author = "Michael Weiss and Arnulf Schiller and Paul O'Leary and Ewald Fauster and Peter Schalk",
year = "2003",
month = dec,
day = "1",
doi = "10.1117/12.514944",
language = "English",
volume = "5132",
pages = "91--102",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",
note = "Sixth International Conference on Quality Control by Artificial Vision ; Conference date: 19-05-2003 Through 22-05-2003",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Development of a Distributed Vision System for Industrial Conditions

AU - Weiss, Michael

AU - Schiller, Arnulf

AU - O'Leary, Paul

AU - Fauster, Ewald

AU - Schalk, Peter

PY - 2003/12/1

Y1 - 2003/12/1

KW - Distributed measurement and vision systems

KW - Fitting

KW - Grassmann reduction

KW - Planner line coordinates

KW - Platform independent communication framework

KW - Quality observation at a wire rolling mill

KW - Singular value decomposition

UR - http://www.scopus.com/inward/record.url?scp=0344512389&partnerID=8YFLogxK

U2 - 10.1117/12.514944

DO - 10.1117/12.514944

M3 - Conference article

AN - SCOPUS:0344512389

VL - 5132

SP - 91

EP - 102

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

T2 - Sixth International Conference on Quality Control by Artificial Vision

Y2 - 19 May 2003 through 22 May 2003

ER -