Connecting in situ TEM mechanical testing with bulk properties of irradiated materials
Research output: Contribution to journal › Article › Research › peer-review
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Connecting in situ TEM mechanical testing with bulk properties of irradiated materials. / Minor, Andrew M.; Hosemann, Peter; Kiener, Daniel.
In: Microscopy and microanalysis, Vol. 18, 2012, p. 1344-1345.
In: Microscopy and microanalysis, Vol. 18, 2012, p. 1344-1345.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Minor, AM, Hosemann, P & Kiener, D 2012, 'Connecting in situ TEM mechanical testing with bulk properties of irradiated materials', Microscopy and microanalysis, vol. 18, pp. 1344-1345. https://doi.org/10.1017/S1431927612008574
APA
Minor, A. M., Hosemann, P., & Kiener, D. (2012). Connecting in situ TEM mechanical testing with bulk properties of irradiated materials. Microscopy and microanalysis, 18, 1344-1345. https://doi.org/10.1017/S1431927612008574
Vancouver
Minor AM, Hosemann P, Kiener D. Connecting in situ TEM mechanical testing with bulk properties of irradiated materials. Microscopy and microanalysis. 2012;18:1344-1345. doi: 10.1017/S1431927612008574
Author
Bibtex - Download
@article{37bf44b27be74e82b409fe4cf8a9a5ab,
title = "Connecting in situ TEM mechanical testing with bulk properties of irradiated materials",
author = "Minor, {Andrew M.} and Peter Hosemann and Daniel Kiener",
year = "2012",
doi = "10.1017/S1431927612008574",
language = "English",
volume = "18",
pages = "1344--1345",
journal = "Microscopy and microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Connecting in situ TEM mechanical testing with bulk properties of irradiated materials
AU - Minor, Andrew M.
AU - Hosemann, Peter
AU - Kiener, Daniel
PY - 2012
Y1 - 2012
U2 - 10.1017/S1431927612008574
DO - 10.1017/S1431927612008574
M3 - Article
VL - 18
SP - 1344
EP - 1345
JO - Microscopy and microanalysis
JF - Microscopy and microanalysis
SN - 1431-9276
ER -
