Conductance and Temperature Measurement System for 1500°C Metallurgical Slag
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Standard
Conductance and Temperature Measurement System for 1500°C Metallurgical Slag. / Korp, Jörg; Maier, Wenzel; Schmid, Andreas et al.
Proceedings of the 7th International Symposium on Actual Problems of Eelctronic Instrument Engineering. 2004. p. 178-182.
Proceedings of the 7th International Symposium on Actual Problems of Eelctronic Instrument Engineering. 2004. p. 178-182.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Harvard
Korp, J, Maier, W, Schmid, A & Weiß, H 2004, Conductance and Temperature Measurement System for 1500°C Metallurgical Slag. in Proceedings of the 7th International Symposium on Actual Problems of Eelctronic Instrument Engineering. pp. 178-182.
APA
Korp, J., Maier, W., Schmid, A., & Weiß, H. (2004). Conductance and Temperature Measurement System for 1500°C Metallurgical Slag. In Proceedings of the 7th International Symposium on Actual Problems of Eelctronic Instrument Engineering (pp. 178-182)
Vancouver
Korp J, Maier W, Schmid A, Weiß H. Conductance and Temperature Measurement System for 1500°C Metallurgical Slag. In Proceedings of the 7th International Symposium on Actual Problems of Eelctronic Instrument Engineering. 2004. p. 178-182
Author
Bibtex - Download
@inproceedings{193d387ee3da47638c06cd188a5ae931,
title = "Conductance and Temperature Measurement System for 1500°C Metallurgical Slag",
author = "J{\"o}rg Korp and Wenzel Maier and Andreas Schmid and Helmut Wei{\ss}",
year = "2004",
language = "English",
pages = "178--182",
booktitle = "Proceedings of the 7th International Symposium on Actual Problems of Eelctronic Instrument Engineering",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Conductance and Temperature Measurement System for 1500°C Metallurgical Slag
AU - Korp, Jörg
AU - Maier, Wenzel
AU - Schmid, Andreas
AU - Weiß, Helmut
PY - 2004
Y1 - 2004
M3 - Conference contribution
SP - 178
EP - 182
BT - Proceedings of the 7th International Symposium on Actual Problems of Eelctronic Instrument Engineering
ER -
