Comparison of CMOS and CCD cameras for laser profiling

Research output: Contribution to journalConference articlepeer-review

External Organisational units

  • University of Kent, Canterbury

Details

Original languageEnglish
Pages (from-to)108-115
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5303
DOIs
Publication statusPublished - 1 Dec 2004
EventMachine Vision Applications in Industrial Inspection XII - San Jose, CA, United States
Duration: 21 Jan 200422 Jan 2004