Characterization of Ni-Pt-O microstructures by analytical electron microscopy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Characterization of Ni-Pt-O microstructures by analytical electron microscopy. / Rom, I.; Schröder, Alexandra; Hofer, F. et al.
Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B. 2000. p. 621-626.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Rom, I, Schröder, A, Hofer, F, Sitte, W & Grogger, W 2000, Characterization of Ni-Pt-O microstructures by analytical electron microscopy. in Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B. pp. 621-626.

Rom, I., Schröder, A., Hofer, F., Sitte, W., & Grogger, W. (2000). Characterization of Ni-Pt-O microstructures by analytical electron microscopy. In Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B (pp. 621-626)

Rom I, Schröder A, Hofer F, Sitte W, Grogger W. Characterization of Ni-Pt-O microstructures by analytical electron microscopy. In Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B. 2000. p. 621-626

Rom, I. ; Schröder, Alexandra ; Hofer, F. et al. / Characterization of Ni-Pt-O microstructures by analytical electron microscopy. Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B. 2000. pp. 621-626

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title = "Characterization of Ni-Pt-O microstructures by analytical electron microscopy",

author = "I. Rom and Alexandra Schr{\"o}der and F. Hofer and Werner Sitte and W. Grogger",

year = "2000",

language = "English",

pages = "621--626",

booktitle = "Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B",

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T1 - Characterization of Ni-Pt-O microstructures by analytical electron microscopy

AU - Rom, I.

AU - Schröder, Alexandra

AU - Hofer, F.

AU - Sitte, Werner

AU - Grogger, W.

PY - 2000

Y1 - 2000

M3 - Conference contribution

SP - 621

EP - 626

BT - Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B

ER -

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