A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction
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| Translated title of the contribution | A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction |
|---|---|
| Original language | English |
| Pages (from-to) | 9-18 |
| Journal | Ultramicroscopy |
| Volume | 144 |
| DOIs | |
| Publication status | Published - 2014 |
