A comprehensive methodology for criticality assessment of microvias in printed circuit board assemblies

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Authors

  • Vikram G. Kamble
  • Dhaval Rasheshkumar Patel
  • Julia Zuendel
  • Thomas Krivec

External Organisational units

  • Polymer Competence Center Leoben GmbH
  • Institute of Mechanics
  • CD-Laboratory for Fatigue Analysis
  • AT and S AG

Details

Original languageEnglish
Title of host publication2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024
PublisherInstitute of Electrical and Electronics Engineers
ISBN (electronic)9798350393637
DOIs
Publication statusPublished - 2024
Event25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024 - Catania, Italy
Duration: 7 Apr 202410 Apr 2024

Publication series

Name2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024

Conference

Conference25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024
Country/TerritoryItaly
CityCatania
Period7/04/2410/04/24