Shaun Lancaster
11 - 18 out of 18Page size: 10
Research output
- Published
Unlocking the Value of Electronic Waste: Inter-laboratory Insights into Critical Element Analysis
Lancaster, S. T., Sahlin, E., Oelze, M., Ostermann, M., Vogl, J., Laperche, V., Touze, S., Ghestem, J. P., Dalencourt, C., Gendre, R., Stammeier, J., Klein, O., Pröfrock, D., Košarac, G., Jotanovic, A., Bergamaschi, L., Di Luzio, M., D'Agostino, G., Jaćimović, R. & Eberhard, M. & 9 others, , 3 Mar 2025.Research output: Contribution to conference › Poster › Research
- Published
Fostering inclusive access to analytical instrumentation
Irrgeher, J., Schober, M., Lancaster, S., Prohaska, T., Trimmel, S. & Wagner, S., 2022.Research output: Contribution to conference › Poster › Transfer
- Published
S2-P3 Fostering inclusive access to analytical instrumentation
Irrgeher, J., Schober, M., Lancaster, S., Trimmel, S., Wagner, S. & Prohaska, T., Aug 2022, p. A18. 1 p.Research output: Contribution to conference › Abstract
- Published
P6.1.CL Fostering inclusive access to analytical instrumentation
Irrgeher, J., Schober, M., Lancaster, S., Trimmel, S., Wagner, S. & Prohaska, T., Sept 2022, p. 107. 1 p.Research output: Contribution to conference › Abstract
- Published
Fostering inclusive access to analytical instrumentation
Irrgeher, J., Schober, M., Lancaster, S., Trimmel, S., Wagner, S. & Prohaska, T., 2023.Research output: Contribution to conference › Poster › Transfer
- Published
We 33 Fostering inclusive access to analytical instrumentation
Irrgeher, J., Schober, M., Lancaster, S., Trimmel, S., Wagner, S. & Prohaska, T., Feb 2023, p. 301. 1 p.Research output: Contribution to conference › Abstract
- Published
P.03 Fostering inclusive access to analytical instrumentation
Irrgeher, J., Schober, M., Lancaster, S., Trimmel, S., Wagner, S. & Prohaska, T., May 2023, p. 47. 1 p.Research output: Contribution to conference › Abstract
- Published
Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE
D'Agostino, G., Oelze, M., Vogl, J., Ghestem, J. P., Lafaurie, N., Klein, O., Pröfrock, D., Di Luzio, M., Bergamaschi, L., Jaćimović, R., Oster, C., Irrgeher, J., Lancaster, S., Walch, A., Röthke, A., Michaliszyn, L., Pramann, A., Rienitz, O., Sara-Aho, T. & Cankur, O. & 2 others, , 18 Sept 2024, In: Journal of analytical atomic spectrometry. 39.2024, 11, p. 2809-2823 15 p.Research output: Contribution to journal › Article › Research › peer-review
