Karl Christian Teichert
Research output
- Published
Leitfähigkeits-Rasterkraftmikroskopie
Teichert, C., 2010, Handbuch der Nanoanalytik Steiermark 2010. p. 72-74Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2
Teichert, C. & Kremmer, S., 2005, In: Journal of electron spectroscopy and related phenomena. 144-147, p. 1163-1166Research output: Contribution to journal › Article › Research › peer-review
- Published
Layer Dependent Wetting in Parahexaphenyl Thin Film Growth on Graphene
Kratzer, M., Klima, S., Teichert, C., Vasić, B., Matković, A., Milicevic, M. & Gajić, R., 2014, In: E-Journal of Surface Science and Nanotechnology. 12, p. 31-39Research output: Contribution to journal › Article › Research › peer-review
- Published
KPFM und biased KPFM auf ZnO-Varistoren
Pavitschitz, A. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Kontaktwinkelmessungen an Stahlproben
Hlawacek, G., Gürkan, N. & Teichert, C., 2008Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Kontaktwinkelmessungen an Kolbenringen
Ganser, C. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Kontaktwinkelmessung an UHPC Oberflächen
Schmied, F., Gürkan, N. & Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Kontaktwinkelmessung an glatten Stahloberflaechen ausgelagert in Ca(OH)2
Schmied, F. & Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators
Mirkowska, M., Kratzer, M., Teichert, C. & Flachberger, H., 2013.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Joint strength measurements of individual fiber-fiber bonds: An atomic force microscopy based method
Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2012, In: Review of scientific instruments. p. 073902-1-073902-8Research output: Contribution to journal › Article › Research › peer-review