Karl Christian Teichert

Activities

  1. 2018
  2. 2019 NanoScientific Forum Europe Scanning Probe Microscopy (SPM), 11-13 September 2019, University of Bologna,Italy

    Gradwohl, K.-P. (Speaker) & Teichert, C. (Participant)

    11 Sept 201813 Sept 2018

    Activity: Participating in or organising an eventParticipation in conference

  3. Viscoelastic properties of pulp fibers investigated by atomic force microscopy

    Czibula, C. M. (Speaker), Ganser, C. (contributor), Hirn, U. (contributor) & Teichert, C. (contributor)

    11 Sept 2018

    Activity: Talk or presentation Oral presentation

  4. Viscoelastic and hygroscopic properties of cellulosic materials investigated by atomic force microscopy methods

    Czibula, C. M. (Speaker), Ganser, C. (contributor), Schennach, R. (contributor), Hirn, U. (contributor) & Teichert, C. (contributor)

    24 Sept 2018

    Activity: Talk or presentation Oral presentation

  5. Formation and characterization of organic nanocrystals on 2D materials

    Teichert, C. (Invited speaker)

    25 Sept 201826 Sept 2018

    Activity: Talk or presentation Invited talk

  6. AFM based investigation and manipulation of organic nanocrystals on 2D materials

    Teichert, C. (Invited speaker)

    10 Oct 201812 Oct 2018

    Activity: Talk or presentation Invited talk

  7. Nanocellulose as stabilizer for burned paper

    Völkel, L. (Speaker), Reindl, P. (contributor), Czibula, C. M. (contributor), Weber, J. (contributor), Teichert, C. (contributor) & Potthast, A. (contributor)

    24 Oct 2018

    Activity: Talk or presentation Oral presentation

  8. Ion-bombardment induced rippled surfaces as templates for organic thin film growth

    Teichert, C. (Invited speaker)

    13 Nov 2018

    Activity: Talk or presentation Invited talk

  9. Viscoelastic properties of pulp fibers investigated by atomic force microscopy

    Czibula, C. M. (Speaker), Ganser, C. (contributor), Hirn, U. (contributor) & Teichert, C. (contributor)

    22 Nov 2018

    Activity: Talk or presentation Oral presentation

  10. 2019
  11. Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys

    Kratzer, M. (Speaker), Huszar, M. (contributor), Tengg, L. M. (contributor), Clemens, H. (contributor), Mayer, S. (Speaker) & Teichert, C. (contributor)

    31 Mar 20195 Apr 2019

    Activity: Talk or presentation Oral presentation