Karl Christian Teichert
Activities
- 2018
2019 NanoScientific Forum Europe Scanning Probe Microscopy (SPM), 11-13 September 2019, University of Bologna,Italy
Gradwohl, K.-P. (Speaker) & Teichert, C. (Participant)
11 Sept 2018 → 13 Sept 2018Activity: Participating in or organising an event › Participation in conference
Viscoelastic properties of pulp fibers investigated by atomic force microscopy
Czibula, C. M. (Speaker), Ganser, C. (contributor), Hirn, U. (contributor) & Teichert, C. (contributor)
11 Sept 2018Activity: Talk or presentation › Oral presentation
Viscoelastic and hygroscopic properties of cellulosic materials investigated by atomic force microscopy methods
Czibula, C. M. (Speaker), Ganser, C. (contributor), Schennach, R. (contributor), Hirn, U. (contributor) & Teichert, C. (contributor)
24 Sept 2018Activity: Talk or presentation › Oral presentation
Formation and characterization of organic nanocrystals on 2D materials
Teichert, C. (Invited speaker)
25 Sept 2018 → 26 Sept 2018Activity: Talk or presentation › Invited talk
AFM based investigation and manipulation of organic nanocrystals on 2D materials
Teichert, C. (Invited speaker)
10 Oct 2018 → 12 Oct 2018Activity: Talk or presentation › Invited talk
Nanocellulose as stabilizer for burned paper
Völkel, L. (Speaker), Reindl, P. (contributor), Czibula, C. M. (contributor), Weber, J. (contributor), Teichert, C. (contributor) & Potthast, A. (contributor)
24 Oct 2018Activity: Talk or presentation › Oral presentation
Advanced AFM techniques to study photoconductivity of inorganic and organic semiconductor nanostructures
Teichert, C. (Invited speaker)
25 Oct 2018Activity: Talk or presentation › Invited talk
Ion-bombardment induced rippled surfaces as templates for organic thin film growth
Teichert, C. (Invited speaker)
13 Nov 2018Activity: Talk or presentation › Invited talk
Viscoelastic properties of pulp fibers investigated by atomic force microscopy
Czibula, C. M. (Speaker), Ganser, C. (contributor), Hirn, U. (contributor) & Teichert, C. (contributor)
22 Nov 2018Activity: Talk or presentation › Oral presentation
- 2019
Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys
Kratzer, M. (Speaker), Huszar, M. (contributor), Tengg, L. M. (contributor), Clemens, H. (contributor), Mayer, S. (Speaker) & Teichert, C. (contributor)
31 Mar 2019 → 5 Apr 2019Activity: Talk or presentation › Oral presentation