Juraj Todt

Research output

  1. 2016
  2. Published

    In-situ Observation of Cross- Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation

    Zeilinger, A., Todt, J., Krywka, C., Müller, M., Ecker, W., Sartory, B., Meindlhumer, M., Stefenelli, M., Daniel, R., Mitterer, C. & Keckes, J., 7 Mar 2016, In: Scientific reports (London : Nature Publishing Group). 6:22670, p. 1-14 14 p.

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Al-rich cubic Al0.8Ti0.2N coating with self-organized nano-lamellar microstructure: Thermal and mechanical properties

    Todt, J., Zalesak, J., Daniel, R., Pitonak, R., Köpf, A., Weißenbacher, R., Sartory, B., Mitterer, C. & Keckes, J., 2016, In: Surface & coatings technology. 291, p. 89-93 5 p.

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published

    Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae

    Zalesak, J., Todt, J., Pitonak, R., Köpf, A., Weißenbacher, R., Sartory, B., Burghammer, M., Daniel, R. & Keckes, J., 2016, In: Journal of applied crystallography. 49, 6, p. 2217-2225 9 p.

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published

    Integrated experimental and computational approach for residual stress investigation near through-silicon vias

    Deluca, M., Hammer, R., Keckes, J., Kraft, J., Schrank, F., Todt, J., Robach, O., Micha, J. S. & Defregger, S., 2016, In: Journal of applied physics. 120, 19

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published
  7. Published

    Nanostructured CVD coatings and cemented carbides-A perfect match?

    Köpf, A., Keckes, J., Todt, J., Pitonak, R. & Weissenbacher, R., 2016, World PM 2016 Congress and Exhibition.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  8. Published

    X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

    Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.

    Research output: Contribution to journalArticleResearchpeer-review

  9. 2015
  10. Published

    Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films

    Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.

    Research output: Contribution to conferencePosterResearchpeer-review

  11. Published

    Thermal expansion of rock-salt cubic AlN

    Bartosik, M., Todt, M., Holec, D., Todt, J., Zhou, L., Riedl, H., Böhm, H. J., Rammerstorfer, F. G. & Mayerhofer, P. H., 2015, In: Applied physics letters. 107, p. 071602-1 - 071602-5

    Research output: Contribution to journalArticleResearchpeer-review

  12. Published

    X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

    Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M. & Keckes, J., 2015, In: Acta materialia. 85, p. 24-31

    Research output: Contribution to journalArticleResearchpeer-review