Fahimeh Saghaeian
(Former)
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Research output
- 2019
- E-pub ahead of print
Microstructure and stress gradients in TiW thin films characterized by 40 nm X-ray diffraction and transmission electron microscopy
Saghaeian, F., Keckes, J., Woehlert, S., Rosenthal, M., Reisinger, M. & Todt, J., 14 Oct 2019, (E-pub ahead of print) In: Thin solid films. 691.2019, 1 December, 7 p., 137576.Research output: Contribution to journal › Article › Research › peer-review
- Published
Design and fabrication of various MEMS-based structures for investigating thermo-mechanical and fatigue behavior of thin metal films and metal barriers
Saghaeian, F., 2019Research output: Thesis › Doctoral Thesis