Fahimeh Saghaeian

(Former)

Research output

  1. 2019
  2. E-pub ahead of print

    Microstructure and stress gradients in TiW thin films characterized by 40 nm X-ray diffraction and transmission electron microscopy

    Saghaeian, F., Keckes, J., Woehlert, S., Rosenthal, M., Reisinger, M. & Todt, J., 14 Oct 2019, (E-pub ahead of print) In: Thin solid films. 691.2019, 1 December, 7 p., 137576.

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published