Daniel Kiener
61 - 70 out of 336Page size: 10
Research output
- Published
Small scale mechanical testing of irradiated materials
Hosemann, P., Shin, C. & Kiener, D., 27 Jan 2015, In: Journal of materials research (JMR). 30, 9, p. 1231-1245 15 p.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Small-scale fracture mechanical investigations on grain boundary doped ultrafine-grained tungsten
Wurmshuber, M., Alfreider, M., Wurster, S., Burtscher, M., Pippan, R. & Kiener, D., 28 Mar 2023, (E-pub ahead of print) In: Acta Materialia. 250.2023, 15 May, 12 p., 118878.Research output: Contribution to journal › Article › Research › peer-review
- Published
Small scale deformation behavior of Au – influence of microstructure and temperature
Maier-Kiener, V., Kiener, D., Leitner, A. & Pippan, R., 18 Feb 2016.Research output: Contribution to conference › Presentation › Research
- Published
Small scale deformation behavior of Au – influence of microstructure and temperature
Maier-Kiener, V., Leitner, T., Kiener, D. & Pippan, R., 2016.Research output: Contribution to conference › Presentation › Research
- Published
Size-Induced Transition from Perfect to Partial Dislocation Plasticity in Single Crystal Au Films on Polyimide
Oh, S. H., Legros, M., Kiener, D., Gruber, P. A. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 278-279Research output: Contribution to journal › Article › Research › peer-review
- Published
Size effects in single crystal plasticity of copper under uniaxial loading
Kiener, D., 2007, 127 p.Research output: Thesis › Doctoral Thesis
- Published
Site Specific Microstructural Evolution of Thermo-mechanically Fatigued Copper Films
Bigl, S., Wurster, S., Cordill, M. J. & Kiener, D., 18 Feb 2015, In: Berg- und hüttenmännische Monatshefte : BHM. 160, 5, p. 235-239 5 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Selective interface toughness measurements of layered thin films
Konetschnik, R., Daniel, R., Brunner, R. & Kiener, D., 9 Mar 2017, In: AIP Advances. 7.2017, 3, 5 p., 035307.Research output: Contribution to journal › Article › Research › peer-review
- Published
Sekundärionen-Massensprektroskopie (SIMS) mittels FIB
Motz, C., Kiener, D., Schöberl, T., Pippan, R. & Dehm, G., 2005, Handbuch der Nanoanalytik. p. 199-200Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing
Moser, G., Felber, H., Rashkova, B., Imrich, P. J., Kirchlechner, C., Grosinger, W., Motz, C., Dehm, G. & Kiener, D., 2012, In: Practical metallography = Praktische Metallographie. 49, p. 343-355Research output: Contribution to journal › Article › Research › peer-review
