Daniel Kiener
Activities
- 2021
Recent advances in applying in-situ electron microscopy for local determination of crack processes
Kiener, D. (Speaker), Alfreider, M. (contributor), Issa, I. (contributor), Wurmshuber, M. (contributor), Burtscher, M. (contributor) & Schmuck, K. S. (contributor)
15 Mar 2021Activity: Talk or presentation › Invited talk
Understanding defect recovery and accommodation and their implications on mechanical performance in irradiated nanocomposite materials
Wurmshuber, M. (Speaker), Frazer, D. (contributor), Balooch, M. (contributor), Issa, I. (contributor), Bachmaier, A. (contributor), Hosemann, P. (contributor) & Kiener, D. (contributor)
15 Mar 2021Activity: Talk or presentation › Oral presentation
In-situ fracture along distinct interface types
Burtscher, M. (Speaker), Alfreider, M. (contributor), Wurmshuber, M. (contributor), Schmuck, K. S. (contributor), Clemens, H. (contributor), Mayer, S. (contributor) & Kiener, D. (contributor)
16 Mar 2021Activity: Talk or presentation › Oral presentation
Complementary in-situ methods for crack evaluation within high-temperature materials at ambient conditions
Burtscher, M. (Speaker), Alfreider, M. (contributor), Wurmshuber, M. (contributor), Schmuck, K. S. (contributor), Clemens, H. (contributor), Mayer, S. (contributor) & Kiener, D. (contributor)
17 Mar 2021Activity: Talk or presentation › Oral presentation
Interface engineered tungsten based nanocomposites and nanofoams for harsh environments
Kiener, D. (Speaker), Zhao, M. (contributor), Issa, I. (contributor) & Wurmshuber, M. (contributor)
17 Mar 2021Activity: Talk or presentation › Invited talk
Exciting possibilities for micro- and nanomechanical testing
Kiener, D. (Invited speaker)
14 Apr 2021Activity: Talk or presentation › Invited talk
Florian Schäfer
Kiener, D. (Host)
1 May 2021 → 30 Sept 2021Activity: Hosting a visitor › Hosting an academic visitor
Advanced in-situ Deformation in SEM & TEM
Kiener, D. (Invited speaker)
7 May 2021Activity: Talk or presentation › Invited talk
In situ Transmission Scanning Electron Microscopy as a Tool to Resolve Interface Related Deformation and Fracture in Multilayered Components
Alfreider, M. (Speaker), Balbus, G. (contributor), Wang, F. (contributor), Gianola, D. S. (contributor) & Kiener, D. (contributor)
20 May 2021Activity: Talk or presentation › Oral presentation
Insights into deformation and fracture enabled by scale bridging in-situ electron microscopy
Kiener, D. (Keynote speaker)
1 Jun 2021Activity: Talk or presentation › Invited talk
