Anna Walch
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Research output
- 2024
- Published
Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE
D'Agostino, G., Oelze, M., Vogl, J., Ghestem, J. P., Lafaurie, N., Klein, O., Pröfrock, D., Di Luzio, M., Bergamaschi, L., Jaćimović, R., Oster, C., Irrgeher, J., Lancaster, S., Walch, A., Röthke, A., Michaliszyn, L., Pramann, A., Rienitz, O., Sara-Aho, T. & Cankur, O. & 2 others, , 18 Sept 2024, In: Journal of analytical atomic spectrometry. 39.2024, 11, p. 2809-2823 15 p.Research output: Contribution to journal › Article › Research › peer-review
- 2022
- Published
Metrology for the recycling of Technology Critical Elements to support Europe’s circular economy
Lancaster, S., Walch, A., Eberhard, M., Rachetti, A., Prohaska, T. & Irrgeher, J., 9 Nov 2022.Research output: Contribution to conference › Poster › Research