Department Physics, Mechanics and Electrical Engineering

Organisational unit: Departments and Institutes

451 - 460 out of 2,419Page size: 10

Activities

  1. ASMET "NumSimPro"

    Gamsjäger, E. (Speaker)

    10 Sept 2008

    Activity: Participating in or organising an eventParticipation in conference

  2. Aspects of Transformation Induced Plasticity - from Nanoscale to Engineering Applications

    Antretter, T. (Speaker)

    3 Jan 2020

    Activity: Talk or presentation Oral presentation

  3. ASPM

    Resch-Fauster, K. (Speaker)

    8 Sept 201010 Sept 2010

    Activity: Participating in or organising an eventParticipation in conference

  4. Assessing Adsorption-Induced Deformation in Hierarchical Porous CMK-3-Type Carbon Materials

    Ludescher, L. (Speaker), Morak, R. (contributor), Balzer, C. (contributor), Braxmeier, S. (contributor), Putz, F. (contributor), Elsaesser, M. S. (contributor), Reichenauer, G. (contributor), Huesing, N. (contributor), Paris, O. (contributor) & Gor, G. Y. (contributor)

    6 May 20188 May 2018

    Activity: Talk or presentation Oral presentation

  5. "Assessing adsorption induced deformation of nanoporous materials with X-ray and neutron scattering" (invited lecture)

    Paris, O. (Invited speaker)

    6 May 20189 May 2018

    Activity: Talk or presentation Invited talk

  6. Assessment und Feedback

    Orthaber, M. (Speaker), Antretter, T. (Speaker) & Smolle, J. (Speaker)

    29 Nov 2021

    Activity: OtherTypes of External academic engagement - Research and Teaching at External Organisation

  7. AT&S internal Presentation

    Hlawacek, G. (Speaker)

    20 Oct 2008

    Activity: Participating in or organising an eventParticipation in conference

  8. Atomic force microscopy (AFM) based method to investigate the transversal viscoelastic properties of paper fibers

    Czibula, C. M. (Speaker), Ganser, C. (contributor), Teichert, C. (contributor) & Hirn, U. (contributor)

    14 Mar 2018

    Activity: Talk or presentation Oral presentation

  9. Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys

    Kratzer, M. (Speaker), Huszar, M. (contributor), Tengg, L. M. (contributor), Clemens, H. (contributor), Mayer, S. (Speaker) & Teichert, C. (contributor)

    31 Mar 20195 Apr 2019

    Activity: Talk or presentation Oral presentation

  10. Atomic Force Microscopy Based Electrical Characterization of Multiphase Intermetallic TiAl Alloys

    Kratzer, M. (Speaker)

    31 Mar 20195 Apr 2019

    Activity: Talk or presentation Oral presentation