Adsorption-Induced Deformation of Hierarchically Structured Mesoporous Silica Effect of Pore-Level Anisotropy

Balzer, C., Waag, A., Gehret, S., Reichenauer, G., Putz, F., Hüsing, N., Paris, O., Bernstein, N., Gor, G. Y. & Neimark, A. V., 6 Jun 2017, In: Langmuir. 33.2017, 22, p. 5592-5602 11 p.

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Mechanical Characterization of Hierarchical Structured Porous Silica by in Situ Dilatometry Measurements during Gas Adsorption

Balzer, C., Waag, A. M., Putz, F., Huesing, N., Paris, O., Gor, G. Y., Neimark, A. V. & Reichenauer, G., 26 Feb 2019, In: Langmuir. 35.2019, 8, p. 2948-2956 9 p.

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Single-crystalline nanoribbon network field effect transistors from arbitrary two-dimensional materials

Aslam, M. A., Tran, T. H., Supina, A., Siri, O., Meunier, V., Watanabe, W., Taniguchi, T., Kralj, M., Teichert, C., Sheremet, E., Rodriguez, R. D. & Matkovic, A., 31 Oct 2022, In: npj 2D materials and applications. 2022, 1, 9 p., 76.

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All van der Waals Semiconducting PtSe₂ Field Effect Transistors with Low Contact Resistance Graphite Electrodes

Aslam, M. A., Leitner, S., Tyagi, S., Provias, A., Tkachuk, V., Pavlica, E., Dienstleder, M., Knez, D., Watanabe, K., Taniguchi, T., Yan, D., Shi, Y., Knobloch, T., Waltl, M., Schwingenschlögl, U., Grasser, T. & Matković, A., 24 May 2024, In: Nano Letters. 24.2024, 22, p. 6529-6537 9 p.

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Magneto-conductance in dot array system at high-magnetic fields

Aoki, N., Lin, L., Ochiai, Y., Ishibashi, K., Aoyagi, Y., Bird, J., Ferry, D. K. & Oswald, J., 2002, In: Physica E: Low-dimensional systems & nanostructures. p. 769-772

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A drastic change of the effective g-value in nanostructure system: Zeeman attenuator

Aoki, N., Lin, L., Oonishi, D., Kida, M., Iwase, Y., Ishibashi, K., Aoyagi, Y., Bird, J. P., Ferry, D. K., Oswald, J. & Ochiai, Y., 2002, In: Physica B: Condensed Matter. 314, 1, p. 235-238

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Coherent random lasing in the deep blue from self-assembled organic nanofibers

Andreev, A., Quochi, F., Cordella, F., Mura, A., Bongiovanni, G., Sitter, H., Hlawacek, G., Teichert, C. & Sariciftci, N. S., 2006, In: Journal of applied physics. 99, p. 034305-1-034305-6

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