Chair of Functional Materials and Materials Systems (425)
Organisational unit: Chair
Research output
- 2015
- Published
Origin of temperature-induced low friction of sputtered Si-containing amorphous carbon coatings
Jantschner, O., Field, S. K., Holec, D., Fian, A., Music, D., Schneider, J. M., Zorn, K. & Mitterer, C., 2015, In: Acta materialia. 82, p. 437-446Research output: Contribution to journal › Article › Research › peer-review
- Published
Pencil-beam X-ray nanodiffraction on CVD α-Al2O3 hard coatings with grain sizes in the micrometer range
Tkadletz, M., Keckes, J., Schalk, N., Czettl, C. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Phase changes observed on AlCr composite cathodes after exposure to cathodic arc plasmas in N2 and O2 atmospheres
Franz, R., Mendez Martin, F., Hawranek, G. & Polcik, P., 2015.Research output: Contribution to conference › Presentation › Research
- Published
Recent progress in advanced characterization methods for the development of hard coatings: From improved composition/microstructure/property relations to insights in degradation behavior
Mitterer, C., Mühlbacher, M., Zeilinger, A., Stefenelli, M., Daniel, R., Tkadletz, M., Schalk, N., Sartory, B. & Keckes, J., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Residual stress gradients in α-Al2O3 hard coatings determined by pencil-beam X-ray nanodiffraction: The influence of blasting media
Tkadletz, M., Keckes, J., Schalk, N., Krajinovic, I., Burghammer, M., Czettl, C. & Mitterer, C., 2015, In: Surface & coatings technology. 262, p. 134 - 140 7 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Resolving depth evolution of microstructure and hardness in sputtered CrN film
Zeilinger, A., Daniel, R., Schöberl, T., Stefenelli, M., Sartory, B., Keckes, J. & Mitterer, C., 2015, In: Thin solid films. 581.2015, April, p. 75-79Research output: Contribution to journal › Article › Research › peer-review
- Published
Restrictions of wafer curvature stress measurements by thermally induced plastic substrate deformation
Saringer, C., Tkadletz, M. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films
Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Structure, phase evolution and mechanical properties of HiPIMS, pulsed DC and DC sputtered Ta-N films
Marihart, H., 2015Research output: Thesis › Diploma Thesis
- Published
Structure-property relations in reactively sputtered molybdenum oxide thin films
Pachlhofer, J., Jachs, C., Franz, R., Franzke, E., Winkler, J. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review