Microscopy and microanalysis, ‎1431-9276

Journal

ISSNs1431-9276

Research output

  1. Published

    Conventional TEM investigation of the FIB damage in copper

    Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 100-101

    Research output: Contribution to journalArticleResearchpeer-review

  2. Published

    Linking Macroscopic Fracture Properties to Single Dislocation Processes

    Issa, I., Alfreider, M., Kozic, D., Kolednik, O., Sandfeld, S. & Kiener, D., Aug 2018, In: Microscopy and microanalysis. 24.2018, Supplement S1, p. 2184-2185 2 p.

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published
  4. Published

    Extreme ductility at the nanoscale in Fe-based alloys

    Hintsala, E., Kiener, D. & Gerberich, W. W., 1 Aug 2014, In: Microscopy and microanalysis. 20, 3, p. 1876-1877 2 p.

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published
  6. Published

    Atom probe tomography for isotopic analysis: development of the 34S/32S system in sulfides

    Gopon, P., Douglas, J., Meisenkothen, F., Singh, J., London, A. & Moody, M., 2021, In: Microscopy and microanalysis.

    Research output: Contribution to journalArticleResearchpeer-review

  7. Published

    Quantitative Approaches for in situ SEM and TEM Deformation Studies

    Dehm, G., Kiener, D., Motz, C., Pippan, R. & Smolka, M., 2012, In: Microscopy and microanalysis. 18, p. 736-737

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published

    Sensitivity and Quantitativity in Atom Probe Tomography

    Danoix, F., Bostel, A., Leitner, H., Jessner, P., Sauvage, X., Gouné, M. & Danoix, R., 2009, In: Microscopy and microanalysis. p. 258-259

    Research output: Contribution to journalArticleResearchpeer-review

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