Microscopy and microanalysis, 1431-9276
Journal
ISSNs | 1431-9276 |
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Research output
- Published
Conventional TEM investigation of the FIB damage in copper
Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 100-101Research output: Contribution to journal › Article › Research › peer-review
- Published
Linking Macroscopic Fracture Properties to Single Dislocation Processes
Issa, I., Alfreider, M., Kozic, D., Kolednik, O., Sandfeld, S. & Kiener, D., Aug 2018, In: Microscopy and microanalysis. 24.2018, Supplement S1, p. 2184-2185 2 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Lock-In Infrared Microscopy on ZnO Ceramics - A Complementary Investigation Technique for the Analysis of Functional Electroceramic Components
Hofstätter, M., Raidl, N., Sartory, B. & Supancic, P., 2015, In: Microscopy and microanalysis. 21, p. 1145-1152 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Extreme ductility at the nanoscale in Fe-based alloys
Hintsala, E., Kiener, D. & Gerberich, W. W., 1 Aug 2014, In: Microscopy and microanalysis. 20, 3, p. 1876-1877 2 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Diagenetic Evolution and Reservoir Quality of Sandstones in the North Alpine Foreland Basin: A Microscale Approach
Groß, D., Grundtner, M.-L., Misch, D., Riedl, M., Sachsenhofer, R. & Scheucher, L., 6 Jun 2015, In: Microscopy and microanalysis. 21, 5, 15 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Atom probe tomography for isotopic analysis: development of the 34S/32S system in sulfides
Gopon, P., Douglas, J., Meisenkothen, F., Singh, J., London, A. & Moody, M., 2021, In: Microscopy and microanalysis.Research output: Contribution to journal › Article › Research › peer-review
- Published
Quantitative Approaches for in situ SEM and TEM Deformation Studies
Dehm, G., Kiener, D., Motz, C., Pippan, R. & Smolka, M., 2012, In: Microscopy and microanalysis. 18, p. 736-737Research output: Contribution to journal › Article › Research › peer-review
- Published
Sensitivity and Quantitativity in Atom Probe Tomography
Danoix, F., Bostel, A., Leitner, H., Jessner, P., Sauvage, X., Gouné, M. & Danoix, R., 2009, In: Microscopy and microanalysis. p. 258-259Research output: Contribution to journal › Article › Research › peer-review