X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film. / Steffenelli, M.; Daniel, Rostislav; Ecker, W et al.
in: Acta materialia, Jahrgang 85, 2015, S. 24-31.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{33beb50064ec4d208ca0b84f9d903074,
title = "X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film",
author = "M. Steffenelli and Rostislav Daniel and W Ecker and Daniel Kiener and Juraj Todt and A. Zeilinger and Christian Mitterer and M. Burghammer and Jozef Keckes",
year = "2015",
doi = "10.1016/j.actamat.2014.11.011",
language = "English",
volume = "85",
pages = "24--31",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

AU - Steffenelli, M.

AU - Daniel, Rostislav

AU - Ecker, W

AU - Kiener, Daniel

AU - Todt, Juraj

AU - Zeilinger, A.

AU - Mitterer, Christian

AU - Burghammer, M.

AU - Keckes, Jozef

PY - 2015

Y1 - 2015

U2 - 10.1016/j.actamat.2014.11.011

DO - 10.1016/j.actamat.2014.11.011

M3 - Article

VL - 85

SP - 24

EP - 31

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

ER -