X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film. / Steffenelli, M.; Daniel, Rostislav; Ecker, W et al.
in: Acta materialia, Jahrgang 85, 2015, S. 24-31.
in: Acta materialia, Jahrgang 85, 2015, S. 24-31.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Steffenelli, M, Daniel, R, Ecker, W, Kiener, D, Todt, J, Zeilinger, A, Mitterer, C, Burghammer, M & Keckes, J 2015, 'X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film', Acta materialia, Jg. 85, S. 24-31. https://doi.org/10.1016/j.actamat.2014.11.011
APA
Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M., & Keckes, J. (2015). X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film. Acta materialia, 85, 24-31. https://doi.org/10.1016/j.actamat.2014.11.011
Vancouver
Steffenelli M, Daniel R, Ecker W, Kiener D, Todt J, Zeilinger A et al. X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film. Acta materialia. 2015;85:24-31. doi: 10.1016/j.actamat.2014.11.011
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Bibtex - Download
@article{33beb50064ec4d208ca0b84f9d903074,
title = "X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film",
author = "M. Steffenelli and Rostislav Daniel and W Ecker and Daniel Kiener and Juraj Todt and A. Zeilinger and Christian Mitterer and M. Burghammer and Jozef Keckes",
year = "2015",
doi = "10.1016/j.actamat.2014.11.011",
language = "English",
volume = "85",
pages = "24--31",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
AU - Steffenelli, M.
AU - Daniel, Rostislav
AU - Ecker, W
AU - Kiener, Daniel
AU - Todt, Juraj
AU - Zeilinger, A.
AU - Mitterer, Christian
AU - Burghammer, M.
AU - Keckes, Jozef
PY - 2015
Y1 - 2015
U2 - 10.1016/j.actamat.2014.11.011
DO - 10.1016/j.actamat.2014.11.011
M3 - Article
VL - 85
SP - 24
EP - 31
JO - Acta materialia
JF - Acta materialia
SN - 1359-6454
ER -
