X-ray characterization of semiconductor nanostructures
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
X-ray characterization of semiconductor nanostructures. / Holy, Vaclav; Buljan, Maja; Lechner, Rainer T.
in: Semiconductor science and technology, Jahrgang 26, 2011, S. 064002/1- 064002/7.
in: Semiconductor science and technology, Jahrgang 26, 2011, S. 064002/1- 064002/7.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Holy, V, Buljan, M & Lechner, RT 2011, 'X-ray characterization of semiconductor nanostructures', Semiconductor science and technology, Jg. 26, S. 064002/1- 064002/7. https://doi.org/10.1088/0268-1242/26/6/064002
APA
Holy, V., Buljan, M., & Lechner, R. T. (2011). X-ray characterization of semiconductor nanostructures. Semiconductor science and technology, 26, 064002/1- 064002/7. https://doi.org/10.1088/0268-1242/26/6/064002
Vancouver
Holy V, Buljan M, Lechner RT. X-ray characterization of semiconductor nanostructures. Semiconductor science and technology. 2011;26:064002/1- 064002/7. doi: 10.1088/0268-1242/26/6/064002
Author
Bibtex - Download
@article{14bca1a024484604a958d1b7d9fb6f35,
title = "X-ray characterization of semiconductor nanostructures",
author = "Vaclav Holy and Maja Buljan and Lechner, {Rainer T.}",
year = "2011",
doi = "10.1088/0268-1242/26/6/064002",
language = "English",
volume = "26",
pages = "064002/1-- 064002/7",
journal = "Semiconductor science and technology",
issn = "0268-1242",
publisher = "IOP Publishing Ltd.",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - X-ray characterization of semiconductor nanostructures
AU - Holy, Vaclav
AU - Buljan, Maja
AU - Lechner, Rainer T.
PY - 2011
Y1 - 2011
U2 - 10.1088/0268-1242/26/6/064002
DO - 10.1088/0268-1242/26/6/064002
M3 - Article
VL - 26
SP - 064002/1- 064002/7
JO - Semiconductor science and technology
JF - Semiconductor science and technology
SN - 0268-1242
ER -
