Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM

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Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. / Cazottes, Sophie; Zhang, Zaoli; Daniel, Rostislav et al.
in: Thin solid films, Jahrgang 519, 2010, S. 1662-1667.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Cazottes, Sophie ; Zhang, Zaoli ; Daniel, Rostislav et al. / Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. in: Thin solid films. 2010 ; Jahrgang 519. S. 1662-1667.

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@article{1d55bd77eb8f4b2fbe8556ec7feea118,
title = "Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM",
author = "Sophie Cazottes and Zaoli Zhang and Rostislav Daniel and J.S. Chawla and D. Gall and Gerhard Dehm",
year = "2010",
language = "English",
volume = "519",
pages = "1662--1667",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM

AU - Cazottes, Sophie

AU - Zhang, Zaoli

AU - Daniel, Rostislav

AU - Chawla, J.S.

AU - Gall, D.

AU - Dehm, Gerhard

PY - 2010

Y1 - 2010

M3 - Article

VL - 519

SP - 1662

EP - 1667

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -