Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. / Cazottes, Sophie; Zhang, Zaoli; Daniel, Rostislav et al.
in: Thin solid films, Jahrgang 519, 2010, S. 1662-1667.
in: Thin solid films, Jahrgang 519, 2010, S. 1662-1667.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Cazottes, S, Zhang, Z, Daniel, R, Chawla, JS, Gall, D & Dehm, G 2010, 'Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM', Thin solid films, Jg. 519, S. 1662-1667.
APA
Cazottes, S., Zhang, Z., Daniel, R., Chawla, J. S., Gall, D., & Dehm, G. (2010). Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. Thin solid films, 519, 1662-1667.
Vancouver
Cazottes S, Zhang Z, Daniel R, Chawla JS, Gall D, Dehm G. Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. Thin solid films. 2010;519:1662-1667.
Author
Bibtex - Download
@article{1d55bd77eb8f4b2fbe8556ec7feea118,
title = "Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM",
author = "Sophie Cazottes and Zaoli Zhang and Rostislav Daniel and J.S. Chawla and D. Gall and Gerhard Dehm",
year = "2010",
language = "English",
volume = "519",
pages = "1662--1667",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM
AU - Cazottes, Sophie
AU - Zhang, Zaoli
AU - Daniel, Rostislav
AU - Chawla, J.S.
AU - Gall, D.
AU - Dehm, Gerhard
PY - 2010
Y1 - 2010
M3 - Article
VL - 519
SP - 1662
EP - 1667
JO - Thin solid films
JF - Thin solid films
SN - 0040-6090
ER -