Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM. / Cazottes, S.; Zhang, Z.L.; Daniel, R. et al.
in: Thin solid films, 2010.
in: Thin solid films, 2010.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Cazottes, S, Zhang, ZL, Daniel, R, Chawla, JS, Gall, D & Dehm, G 2010, 'Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM', Thin solid films. https://doi.org/10.1016/j.tsf.2010.09.017
APA
Cazottes, S., Zhang, Z. L., Daniel, R., Chawla, J. S., Gall, D., & Dehm, G. (2010). Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM. Thin solid films. https://doi.org/10.1016/j.tsf.2010.09.017
Vancouver
Cazottes S, Zhang ZL, Daniel R, Chawla JS, Gall D, Dehm G. Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM. Thin solid films. 2010. doi: 10.1016/j.tsf.2010.09.017
Author
Bibtex - Download
@article{f74cdb3d8d674a83a948ba723a09810b,
title = "Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM",
author = "S. Cazottes and Z.L. Zhang and R. Daniel and J.S. Chawla and D. Gall and G. Dehm",
year = "2010",
doi = "10.1016/j.tsf.2010.09.017",
language = "English",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM
AU - Cazottes, S.
AU - Zhang, Z.L.
AU - Daniel, R.
AU - Chawla, J.S.
AU - Gall, D.
AU - Dehm, G.
PY - 2010
Y1 - 2010
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78649726907&partnerID=MN8TOARS
U2 - 10.1016/j.tsf.2010.09.017
DO - 10.1016/j.tsf.2010.09.017
M3 - Article
JO - Thin solid films
JF - Thin solid films
SN - 0040-6090
ER -
