Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM

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Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM. / Cazottes, S.; Zhang, Z.L.; Daniel, R. et al.
in: Thin solid films, 2010.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{f74cdb3d8d674a83a948ba723a09810b,
title = "Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM",
author = "S. Cazottes and Z.L. Zhang and R. Daniel and J.S. Chawla and D. Gall and G. Dehm",
year = "2010",
doi = "10.1016/j.tsf.2010.09.017",
language = "English",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM

AU - Cazottes, S.

AU - Zhang, Z.L.

AU - Daniel, R.

AU - Chawla, J.S.

AU - Gall, D.

AU - Dehm, G.

PY - 2010

Y1 - 2010

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-78649726907&partnerID=MN8TOARS

U2 - 10.1016/j.tsf.2010.09.017

DO - 10.1016/j.tsf.2010.09.017

M3 - Article

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -