Sensitivity and Quantitativity in Atom Probe Tomography
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Sensitivity and Quantitativity in Atom Probe Tomography. / Danoix, Frédéric; Bostel, A; Leitner, Harald et al.
in: Microscopy and microanalysis, 2009, S. 258-259.
in: Microscopy and microanalysis, 2009, S. 258-259.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Danoix, F, Bostel, A, Leitner, H, Jessner, P, Sauvage, X, Gouné, M & Danoix, R 2009, 'Sensitivity and Quantitativity in Atom Probe Tomography', Microscopy and microanalysis, S. 258-259. https://doi.org/10.1017/S1431927609098195
APA
Danoix, F., Bostel, A., Leitner, H., Jessner, P., Sauvage, X., Gouné, M., & Danoix, R. (2009). Sensitivity and Quantitativity in Atom Probe Tomography. Microscopy and microanalysis, 258-259. https://doi.org/10.1017/S1431927609098195
Vancouver
Danoix F, Bostel A, Leitner H, Jessner P, Sauvage X, Gouné M et al. Sensitivity and Quantitativity in Atom Probe Tomography. Microscopy and microanalysis. 2009;258-259. doi: 10.1017/S1431927609098195
Author
Bibtex - Download
@article{68d3d2dc937c43b8a03edeacb4987515,
title = "Sensitivity and Quantitativity in Atom Probe Tomography",
author = "Fr{\'e}d{\'e}ric Danoix and A Bostel and Harald Leitner and P Jessner and X Sauvage and M. Goun{\'e} and R Danoix",
year = "2009",
doi = "10.1017/S1431927609098195",
language = "English",
pages = "258--259",
journal = "Microscopy and microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Sensitivity and Quantitativity in Atom Probe Tomography
AU - Danoix, Frédéric
AU - Bostel, A
AU - Leitner, Harald
AU - Jessner, P
AU - Sauvage, X
AU - Gouné, M.
AU - Danoix, R
PY - 2009
Y1 - 2009
U2 - 10.1017/S1431927609098195
DO - 10.1017/S1431927609098195
M3 - Article
SP - 258
EP - 259
JO - Microscopy and microanalysis
JF - Microscopy and microanalysis
SN - 1431-9276
ER -
