Reliable atom probe tomography of Cu nanoparticles through tailored encapsulation by an electrodeposited film
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Reliable atom probe tomography of Cu nanoparticles through tailored encapsulation by an electrodeposited film. / Cicek, Aydan; Knabl, Florian; Schiester, Maximilian et al.
in: Nanomaterials, Jahrgang 2025, Nr. 15, 2025, S. 1-13.
in: Nanomaterials, Jahrgang 2025, Nr. 15, 2025, S. 1-13.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Cicek A, Knabl F, Schiester M, Waldl H, Rafailovic L, Tkadletz M et al. Reliable atom probe tomography of Cu nanoparticles through tailored encapsulation by an electrodeposited film. Nanomaterials. 2025;2025(15):1-13. doi: 10.3390/nano15010043
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Bibtex - Download
@article{c346491213224eb38e42dd0728b6c3d5,
title = "Reliable atom probe tomography of Cu nanoparticles through tailored encapsulation by an electrodeposited film",
author = "Aydan Cicek and Florian Knabl and Maximilian Schiester and Helene Waldl and Lidija Rafailovic and Michael Tkadletz and Christian Mitterer",
year = "2025",
doi = "10.3390/nano15010043",
language = "English",
volume = "2025",
pages = "1--13",
journal = "Nanomaterials",
issn = "2079-4991",
publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",
number = "15",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Reliable atom probe tomography of Cu nanoparticles through tailored encapsulation by an electrodeposited film
AU - Cicek, Aydan
AU - Knabl, Florian
AU - Schiester, Maximilian
AU - Waldl, Helene
AU - Rafailovic, Lidija
AU - Tkadletz, Michael
AU - Mitterer, Christian
PY - 2025
Y1 - 2025
U2 - 10.3390/nano15010043
DO - 10.3390/nano15010043
M3 - Article
VL - 2025
SP - 1
EP - 13
JO - Nanomaterials
JF - Nanomaterials
SN - 2079-4991
IS - 15
ER -
