Morphology characterization and friction coefficient determination of sputtered V2O5 films
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Morphology characterization and friction coefficient determination of sputtered V2O5 films. / Klünsner, Thomas; Shen, Quan; Hlawacek, G et al.
in: Thin solid films, Jahrgang 519, 2010, S. 1416-1420.
in: Thin solid films, Jahrgang 519, 2010, S. 1416-1420.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Klünsner T, Shen Q, Hlawacek G, Teichert C, Fateh N, Fontalvo G et al. Morphology characterization and friction coefficient determination of sputtered V2O5 films. Thin solid films. 2010;519:1416-1420. doi: 10.1016/j.tsf.2010.09.040
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@article{b801a374587d42dbabd800ea2a0d4827,
title = "Morphology characterization and friction coefficient determination of sputtered V2O5 films",
author = "Thomas Kl{\"u}nsner and Quan Shen and G Hlawacek and Christian Teichert and Nazanin Fateh and Gerardo Fontalvo and Christian Mitterer",
year = "2010",
doi = "10.1016/j.tsf.2010.09.040",
language = "English",
volume = "519",
pages = "1416--1420",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Morphology characterization and friction coefficient determination of sputtered V2O5 films
AU - Klünsner, Thomas
AU - Shen, Quan
AU - Hlawacek, G
AU - Teichert, Christian
AU - Fateh, Nazanin
AU - Fontalvo, Gerardo
AU - Mitterer, Christian
PY - 2010
Y1 - 2010
U2 - 10.1016/j.tsf.2010.09.040
DO - 10.1016/j.tsf.2010.09.040
M3 - Article
VL - 519
SP - 1416
EP - 1420
JO - Thin solid films
JF - Thin solid films
SN - 0040-6090
ER -
