Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. / Vaxelaire, N.; Proudhon, H.; Labat, S. et al.
in: New journal of physics, 2010, S. 1-12.
in: New journal of physics, 2010, S. 1-12.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Vaxelaire, N, Proudhon, H, Labat, S, Kirchlechner, C, Keckes, J, Jaques, V, Ravy, S, Forest, S & Thomas, O 2010, 'Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction', New journal of physics, S. 1-12.
APA
Vaxelaire, N., Proudhon, H., Labat, S., Kirchlechner, C., Keckes, J., Jaques, V., Ravy, S., Forest, S., & Thomas, O. (2010). Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New journal of physics, 1-12.
Vancouver
Vaxelaire N, Proudhon H, Labat S, Kirchlechner C, Keckes J, Jaques V et al. Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New journal of physics. 2010;1-12.
Author
Bibtex - Download
@article{bf615004b49d4aeab13d6d05f7e74948,
title = "Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction",
author = "N. Vaxelaire and H. Proudhon and S. Labat and Christoph Kirchlechner and Jozef Keckes and V. Jaques and S. Ravy and S. Forest and O. Thomas",
year = "2010",
language = "English",
pages = "1--12",
journal = "New journal of physics",
issn = "1367-2630",
publisher = "IOP Publishing Ltd.",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
AU - Vaxelaire, N.
AU - Proudhon, H.
AU - Labat, S.
AU - Kirchlechner, Christoph
AU - Keckes, Jozef
AU - Jaques, V.
AU - Ravy, S.
AU - Forest, S.
AU - Thomas, O.
PY - 2010
Y1 - 2010
M3 - Article
SP - 1
EP - 12
JO - New journal of physics
JF - New journal of physics
SN - 1367-2630
ER -
