Macroscopic damage modeling for silicon nitride
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Macroscopic damage modeling for silicon nitride. / Ruck, Johannes; Othmani, Yamen; Lube, Tanja et al.
in: Proceedings in applied mathematics and mechanics, Jahrgang 15, 2015, S. 147-148.
in: Proceedings in applied mathematics and mechanics, Jahrgang 15, 2015, S. 147-148.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Ruck, J, Othmani, Y, Lube, T, Khader, I, Kailer, A & Böhlke, T 2015, 'Macroscopic damage modeling for silicon nitride', Proceedings in applied mathematics and mechanics, Jg. 15, S. 147-148.
APA
Ruck, J., Othmani, Y., Lube, T., Khader, I., Kailer, A., & Böhlke, T. (2015). Macroscopic damage modeling for silicon nitride. Proceedings in applied mathematics and mechanics, 15, 147-148.
Vancouver
Ruck J, Othmani Y, Lube T, Khader I, Kailer A, Böhlke T. Macroscopic damage modeling for silicon nitride. Proceedings in applied mathematics and mechanics. 2015;15:147-148.
Author
Bibtex - Download
@article{28ceae102dd344fcacd824449cfe3ab9,
title = "Macroscopic damage modeling for silicon nitride",
author = "Johannes Ruck and Yamen Othmani and Tanja Lube and Iyas Khader and Andreas Kailer and Thomas B{\"o}hlke",
note = "86th Annual Meeting of the International Association of Applied Mathematics and Mechanics",
year = "2015",
language = "English",
volume = "15",
pages = "147--148",
journal = "Proceedings in applied mathematics and mechanics",
issn = "1617-7061",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Macroscopic damage modeling for silicon nitride
AU - Ruck, Johannes
AU - Othmani, Yamen
AU - Lube, Tanja
AU - Khader, Iyas
AU - Kailer, Andreas
AU - Böhlke, Thomas
N1 - 86th Annual Meeting of the International Association of Applied Mathematics and Mechanics
PY - 2015
Y1 - 2015
M3 - Article
VL - 15
SP - 147
EP - 148
JO - Proceedings in applied mathematics and mechanics
JF - Proceedings in applied mathematics and mechanics
SN - 1617-7061
ER -
