Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning. / Perz, Martin; Bucher, Edith; Gspan, Christian et al.
in: Solid State Ionics, Jahrgang 288, 2016, S. 22-27.
in: Solid State Ionics, Jahrgang 288, 2016, S. 22-27.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Perz, M, Bucher, E, Gspan, C, Waldhäusl, J, Hofer, F & Sitte, W 2016, 'Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning', Solid State Ionics, Jg. 288, S. 22-27.
APA
Perz, M., Bucher, E., Gspan, C., Waldhäusl, J., Hofer, F., & Sitte, W. (2016). Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning. Solid State Ionics, 288, 22-27.
Vancouver
Perz M, Bucher E, Gspan C, Waldhäusl J, Hofer F, Sitte W. Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning. Solid State Ionics. 2016;288:22-27.
Author
Bibtex - Download
@article{cc16478138664f01a24c9f093a68970d,
title = "Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning",
author = "Martin Perz and Edith Bucher and Christian Gspan and J{\"o}rg Waldh{\"a}usl and Ferdinand Hofer and Werner Sitte",
year = "2016",
language = "English",
volume = "288",
pages = "22--27",
journal = "Solid State Ionics",
issn = "0167-2738",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Long-term degradation of La0.6Sr0.4Co0.2Fe0.8O3-δ IT-SOFC cathodes due to silicon poisoning
AU - Perz, Martin
AU - Bucher, Edith
AU - Gspan, Christian
AU - Waldhäusl, Jörg
AU - Hofer, Ferdinand
AU - Sitte, Werner
PY - 2016
Y1 - 2016
M3 - Article
VL - 288
SP - 22
EP - 27
JO - Solid State Ionics
JF - Solid State Ionics
SN - 0167-2738
ER -
