LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2. / Teichert, Christian; Kremmer, Sascha.
in: Journal of electron spectroscopy and related phenomena, Jahrgang 144-147, 2005, S. 1163-1166.
in: Journal of electron spectroscopy and related phenomena, Jahrgang 144-147, 2005, S. 1163-1166.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Teichert, C & Kremmer, S 2005, 'LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2', Journal of electron spectroscopy and related phenomena, Jg. 144-147, S. 1163-1166.
APA
Teichert, C., & Kremmer, S. (2005). LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2. Journal of electron spectroscopy and related phenomena, 144-147, 1163-1166.
Vancouver
Teichert C, Kremmer S. LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2. Journal of electron spectroscopy and related phenomena. 2005;144-147:1163-1166.
Author
Bibtex - Download
@article{438df87cd4634d6b8d58474fc3b89c79,
title = "LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2",
author = "Christian Teichert and Sascha Kremmer",
year = "2005",
language = "English",
volume = "144-147",
pages = "1163--1166",
journal = "Journal of electron spectroscopy and related phenomena",
issn = "0368-2048",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2
AU - Teichert, Christian
AU - Kremmer, Sascha
PY - 2005
Y1 - 2005
M3 - Article
VL - 144-147
SP - 1163
EP - 1166
JO - Journal of electron spectroscopy and related phenomena
JF - Journal of electron spectroscopy and related phenomena
SN - 0368-2048
ER -
