LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2. / Teichert, Christian; Kremmer, Sascha.
in: Journal of electron spectroscopy and related phenomena, Jahrgang 144-147, 2005, S. 1163-1166.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{438df87cd4634d6b8d58474fc3b89c79,
title = "LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2",
author = "Christian Teichert and Sascha Kremmer",
year = "2005",
language = "English",
volume = "144-147",
pages = "1163--1166",
journal = "Journal of electron spectroscopy and related phenomena",
issn = "0368-2048",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - LEEM and XPEEM studies of C-AFM induced surface modifications of thermally grown SiO2

AU - Teichert, Christian

AU - Kremmer, Sascha

PY - 2005

Y1 - 2005

M3 - Article

VL - 144-147

SP - 1163

EP - 1166

JO - Journal of electron spectroscopy and related phenomena

JF - Journal of electron spectroscopy and related phenomena

SN - 0368-2048

ER -