In-situ TEM investigation of toughening in Silicon at small scales

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

Standard

In-situ TEM investigation of toughening in Silicon at small scales. / Issa, Inas; Gammer, Christoph; Kolitsch, Stefan et al.
in: Materials today, Jahrgang 48, Nr. 48, 09.2021, S. 29-37.

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

Harvard

Issa, I, Gammer, C, Kolitsch, S, Hohenwarter, A, Imrich, PJ, Pippan, R & Kiener, D 2021, 'In-situ TEM investigation of toughening in Silicon at small scales', Materials today, Jg. 48, Nr. 48, S. 29-37. https://doi.org/10.1016/j.mattod.2021.03.009

APA

Issa, I., Gammer, C., Kolitsch, S., Hohenwarter, A., Imrich, P. J., Pippan, R., & Kiener, D. (2021). In-situ TEM investigation of toughening in Silicon at small scales. Materials today, 48(48), 29-37. https://doi.org/10.1016/j.mattod.2021.03.009

Vancouver

Issa I, Gammer C, Kolitsch S, Hohenwarter A, Imrich PJ, Pippan R et al. In-situ TEM investigation of toughening in Silicon at small scales. Materials today. 2021 Sep;48(48):29-37. Epub 2021 Jul 3. doi: 10.1016/j.mattod.2021.03.009

Author

Issa, Inas ; Gammer, Christoph ; Kolitsch, Stefan et al. / In-situ TEM investigation of toughening in Silicon at small scales. in: Materials today. 2021 ; Jahrgang 48, Nr. 48. S. 29-37.

Bibtex - Download

@article{215440bb270a4a8a97c282bf34c45b54,
title = "In-situ TEM investigation of toughening in Silicon at small scales",
keywords = "Brittle Ductile Transition (BDT), Fracture toughness, In-situ TEM, Nanoscale fracture experiments, Single crystal (SC) Silicon (Si), Size scale effect, Toughening",
author = "Inas Issa and Christoph Gammer and Stefan Kolitsch and Anton Hohenwarter and Imrich, {Peter J.} and Reinhard Pippan and Daniel Kiener",
note = "Publisher Copyright: {\textcopyright} 2021 The Author(s)",
year = "2021",
month = sep,
doi = "10.1016/j.mattod.2021.03.009",
language = "English",
volume = "48",
pages = "29--37",
journal = "Materials today",
issn = "1369-7021",
publisher = "Elsevier",
number = "48",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - In-situ TEM investigation of toughening in Silicon at small scales

AU - Issa, Inas

AU - Gammer, Christoph

AU - Kolitsch, Stefan

AU - Hohenwarter, Anton

AU - Imrich, Peter J.

AU - Pippan, Reinhard

AU - Kiener, Daniel

N1 - Publisher Copyright: © 2021 The Author(s)

PY - 2021/9

Y1 - 2021/9

KW - Brittle Ductile Transition (BDT)

KW - Fracture toughness

KW - In-situ TEM

KW - Nanoscale fracture experiments

KW - Single crystal (SC) Silicon (Si)

KW - Size scale effect

KW - Toughening

UR - http://www.scopus.com/inward/record.url?scp=85109089641&partnerID=8YFLogxK

U2 - 10.1016/j.mattod.2021.03.009

DO - 10.1016/j.mattod.2021.03.009

M3 - Article

AN - SCOPUS:85109089641

VL - 48

SP - 29

EP - 37

JO - Materials today

JF - Materials today

SN - 1369-7021

IS - 48

ER -

Beziehungsdiagramm anzeigen

Dokumente

360 Link

Zeitschriften in BUGL

Vom selben Autor

Mehr zeigen