Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry. / Taudt, Christopher; Nelsen, Bryan; Schlögl, Sandra et al.
in: Proceedings / MDPI AG , Jahrgang 2.2018, Nr. 13, 1046, 2019.
in: Proceedings / MDPI AG , Jahrgang 2.2018, Nr. 13, 1046, 2019.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Taudt, C, Nelsen, B, Schlögl, S, Koch, E & Hartmann, P 2019, 'Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry', Proceedings / MDPI AG , Jg. 2.2018, Nr. 13, 1046. https://doi.org/10.3390/proceedings2131046
APA
Taudt, C., Nelsen, B., Schlögl, S., Koch, E., & Hartmann, P. (2019). Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry. Proceedings / MDPI AG , 2.2018(13), Artikel 1046. https://doi.org/10.3390/proceedings2131046
Vancouver
Taudt C, Nelsen B, Schlögl S, Koch E, Hartmann P. Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry. Proceedings / MDPI AG . 2019;2.2018(13):1046. doi: 10.3390/proceedings2131046
Author
Bibtex - Download
@article{525492d7d84546f584a7bdc1cbf8f472,
title = "Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry",
author = "Christopher Taudt and Bryan Nelsen and Sandra Schl{\"o}gl and Edmund Koch and Peter Hartmann",
year = "2019",
doi = "10.3390/proceedings2131046",
language = "English",
volume = "2.2018",
journal = "Proceedings / MDPI AG ",
issn = "2504-3900",
publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",
number = "13",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Fast Cross-Linking-Characterization of Waveguide-Polymers on Wafers by Imaging Low-Coherence Interferometry
AU - Taudt, Christopher
AU - Nelsen, Bryan
AU - Schlögl, Sandra
AU - Koch, Edmund
AU - Hartmann, Peter
PY - 2019
Y1 - 2019
U2 - 10.3390/proceedings2131046
DO - 10.3390/proceedings2131046
M3 - Article
VL - 2.2018
JO - Proceedings / MDPI AG
JF - Proceedings / MDPI AG
SN - 2504-3900
IS - 13
M1 - 1046
ER -
